Two-dimensional Imaging Velocimetry of High-Strain Rate Deformation in Silicon S. J. Ali,Raymond A. Smith,Cynthia Bolme,David J. Erskine,P. M. Celliers,J. H. Eggert,Jue Wang,S. Brygoo,Benjamin Hammel,Gilbert Collins,Raymond JeanlozBulletin of the American Physical Society（2013）引用 23|浏览0暂无评分AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
