Latest Improvements on Silicon Drift Detectors for Fast, High Resolution EDX Spectroscopy in Electron Microscopy.

A Niculae,S Aschauer,M Bornschlegl,K Hermenau, K Heizinger, S Reinl,H Soltau,L Strüder

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada（2023）

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silicon drift detectors,high resolution edx spectroscopy,electron

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