Effect of Ni Incorporation on Structural, Optical, Morphological Properties of ZnO Thin Films Deposited by Laser Ablation

Journal of materials science Materials in electronics（2023）

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摘要

The structural, optical and morphological properties of Ni-doped ZnO (NZO) thin films were studied by X-ray diffraction (XRD), ultraviolet–visible absorbance spectroscopy (UV–Vis), Photoluminescence spectroscopy (PL), atomic force microscopy (AFM), Field emission scanning electron spectroscopy (FESEM) and Fourier transform infrared spectroscopy (FTIR). 0

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