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Response of mechanical properties and subsurface damage in β-SiC to temperature and crystal plane during nanoindentation simulation

Jingjing Chen, Hao Wu,Shuhua Bai, Jinliang Huang

Materials Science in Semiconductor Processing(2023)

Cited 0|Views3
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Key words
Nanoindentation test,Temperature response,Plastic loop,Molecular simulation,Subsurface damage,Mechanical properties
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