RT Fs X-ray Diffraction of Photosystem II, First Illuminated State
J. Kern,R. Alonso-Mori,R. Tran,J. Hattne,R.J. Gildea,N. Echols,C. Gloeckner,J. Hellmich,H. Laksmono,R.G. Sierra,B. Lassalle-Kaiser,S. Koroidov,A. Lampe,G. Han,S. Gul,D. DiFiore,D. Milathianaki,A.R. Fry,A. Miahnahri,D.W. Schafer,M. Messerschmidt,M.M. Seibert,J.E. Koglin,D. Sokaras,T.-C. Weng,J. Sellberg,M.J. Latimer,R.W. Grosse-Kunstleve,P.H. Zwart,W.E. White,P. Glatzel,P.D. Adams,M.J. Bogan, G.J. Williams,S. Boutet,J. Messinger,A. Zouni,N.K. Sauter,V.K. Yachandra,U. Bergmann,J. Yano semanticscholar（2013）
关键词
X-ray Solution Scattering,Small-Angle Scattering,High-Throughput Crystallization
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