Performance of Almost Edgeless Silicon Detectors in CTS and 3D-Planar Technologies
E Alagoz,G Anelli,G Antchev,V Avati,V Bassetti,V Berardi,V Boccone,M Bozzo,E Brücken,A Buzzo,M G Catanesi,S Cuneo,C Da Vià,M Deile,R Dinapoli,K Eggert,V Eremin,F Ferro,J Hasi,F Haug, J Heino,P Jarron,J Kalliopuska,J Kašpar,C Kenney,A Kok,V Kundrát,K Kurvinen,R Lauhakangas,E Lippmaa,M Lokajíček, T Luntama,D Macina,M Macrí,S Minutoli, L Mirabito,H Niewiadomski,E Noschis,F Oljemark,R Orava,M Oriunno,K Österberg,S Parker, A -L Perrot,E Radermacher,E Radicioni,G Ruggiero,H Saarikko,A Santroni,G Sette,P Siegrist, J Smotlacha,W Snoeys,C Taylor,S Watts,J Whitmore Journal of Instrumentation（2013）
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