Process Voltage Temperature Variability Estimation of Tunneling Current for Band-to-Band-Tunneling Based Neuron

Shubham Patil,Anand Sharma, R. Gaurav,Abhishek Kadam,Ajay Kumar Singh,Sandip Lashkare,Nihar Ranjan Mohapatra,Udayan Ganguly

IEEE TRANSACTIONS ON ELECTRON DEVICES（2024）

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关键词

Band-to-band-tunneling (BTBT),neuron,on regime (ION),process variability,silicon-on-insulator (SOI),subthreshold regime (SS),temperature variability,voltage variability

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