High-speed drift tracking for high-throughput localization microscopy

We present a drift tracking algorithm for high throughput localization microscopy. Compared to the conventional drift estimation algorithms that are usually based on image cross-correlation, our method directly performs on the emitter positions and only calculates the local intersection map between the position sets. Our method can significantly accelerate the computation speed and reduce memory usage to enable high precision, high throughput drift estimation. We demonstrate that our algorithm can achieve a sub-second drift tracking time interval and sub-nanometer tracking precision for the high throughput localization microscopy. Our method paves the way for drift-free high throughput localization microscopy.