Trap Characteristics of Hafnium Oxide-Based Ferroelectric Field-Effect Transistors Measured by Using a Current Transient MethodYilin Li,Hui Zhu,Xing Liu,Xiaolei Wang,Hao Xu,Shijie Pan,Jinjuan Xiang,Lixing Zhou,Zhiwen Yao,Yerong Sun,Shiwei FengApplied Physics Letters（2023）引用 0|浏览13暂无评分AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
