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Top-down Patterning of Topological Surface and Edge States Using a Focused Ion Beam

NATURE COMMUNICATIONS(2023)

Institute for Superconducting and Electronic Materials (ISEM) | The Australian Research Council Centre for Excellence in Future Low Energy Electronics Technologies | Chemical and Quantum Physics | Physics Department | Institute of Photonic Chips | Electron Microscopy Centre | The Australian Nuclear Science and Technology Organisation (ANSTO) | School of Physics

Cited 3|Views28
Abstract
The conducting boundary states of topological insulators appear at an interface where the characteristic invariant ℤ2 switches from 1 to 0. These states offer prospects for quantum electronics; however, a method is needed to spatially-control ℤ2 to pattern conducting channels. It is shown that modifying Sb2Te3 single-crystal surfaces with an ion beam switches the topological insulator into an amorphous state exhibiting negligible bulk and surface conductivity. This is attributed to a transition from ℤ2 = 1 → ℤ2 = 0 at a threshold disorder strength. This observation is supported by density functional theory and model Hamiltonian calculations. Here we show that this ion-beam treatment allows for inverse lithography to pattern arrays of topological surfaces, edges and corners which are the building blocks of topological electronics.
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Design,synthesis and processing,Surface patterning,Topological insulators,Science,Humanities and Social Sciences,multidisciplinary
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要点】:本文提出了一种使用聚焦离子束技术对拓扑绝缘体表面和边缘状态进行自上而下的图案化方法,实现了对拓扑表面导电通道的空间控制。

方法】:通过聚焦离子束对Sb2Te3单晶表面进行修饰,将拓扑绝缘体转变为表现出可忽略不计的体积和表面导电性的非晶态。

实验】:实验通过修改Sb2Te3单晶表面,实现了从拓扑绝缘态到非拓扑绝缘态的转变,并使用密度泛函理论和模型哈密顿量计算支持了这一观察,实验结果展示了通过离子束处理可以实现拓扑表面、边缘和角落数组的图案化。数据集名称未在摘要中明确提及。