Defect Redistribution along Grain Boundaries in SrTiO3 by Externally Applied Electric Fields

Boyi Qu,Daria Eiteneer,Lauren A. Hughes,Jan-Helmut Preusker,Joseph Wood,Wolfgang Rheinheimer,Michael J. Hoffmann,Klaus van Benthem

Journal of the European Ceramic Society（2023）

Cited 9|Views5
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Key words
Grain boundary,Electric field,STEM,Oxygen vacancy migration
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