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A Transistor Array for Extracting Total Ionizing Dose Threshold Voltage Shifts

Lawrence T. Clark,Clifford S. YoungSciortino,Maximilian Siath, Leonardo Martinez,William E. Brown, Shayena Khandker, Azad Derbedrosian, Sungho Kim,Ryan Melendez,Steven M. Guertin,Jean Yang-Scharlotta

2022 IEEE INTERNATIONAL INTEGRATED RELIABILITY WORKSHOP, IIRW（2022）

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Total ionizing dose,silicon on insulator,reliability assessment
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