Modeling of SiC Transistor with Counter-Doped Channel

Pratik B. Vyas,Ashish Pal,Stephen Weeks, Joshua Holt, Aseem K. Srivastava, Ludovico Megalini,Siddharth Krishnan,Michael Chudzik,El Mehdi Bazizi,Buvna Ayyagari-Sangamalli

SOLID-STATE ELECTRONICS（2023）

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关键词
Silicon carbide,SiC,Counter doping,Mobility,Dit,Interface traps,Surface roughness
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