Yield Degradation Mechanisms for Two-Shock Capsules Evaluated Through Simulations
P. A. Bradley,B. M. Haines,G. A. Kyrala,S. A. MacLaren,J. D. Salmonson,J. E. Pino,K. K. Mackay,R. R. Peterson,A. Yi,L. Yin,R. E. Olson,N. Krasheninnikova,S. H. Batha,J. L. Kline,J. P. Sauppe,S. M. Finnegan,A. Pak,T. Ma,T. R. Dittrich,E. L. Dewald,S. F. Khan,D. Sayre,R. Tommasini,J. E. Ralph,J. E. Field,L. Masse,R. E. Tipton,A. J. Mackinnon,L. R. Benedetti,S. R. Nagel,D. K. Bradley,P. M. Celliers,L. Berzak Hopkins,N. Izumi,P. Kervin,C. Yeamans,R. Hatarik,E. P. Hartouni,D. P. Turnbull,K. C. Chen,D. E. Hoover Physics of plasmas（2022）
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