Reference Survey Spectra of Elemental Solid Measured with Cr Kα Photons As a Tool for Quases Analysis (4): Group III and IV Elements (B, Al, In, C, Si, Ge, Sn, Pb)

Several pure bulk materials were analyzed using laboratory-based hard x-ray photoelectron spectroscopy. The spectra are surveys measured using monochromatic Cr Kα radiation at 5414.8 eV after removal of surface contamination or oxidation. These aim to be references for inelastic background analysis using the Tougaard method.