The End-of-Substructure Card for the ATLAS ITk Strip Detector: Status of the Electronics Design and Results from Recent Quality Control Tests
2021 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)（2021）
关键词
End-of-Substructure card,ATLAS ITk strip detector,electronics design,silicon tracker,ATLAS experiment,upcoming High-Luminosity Upgrade,main building blocks,strip tracker,silicon sensors,hybrid PCBs,carbon-fibre substructures,staves,central barrel region,end-cap regions,control signals,off-detector systems,module front-end ASICs,transfer data,differential lines,low-powered GigaBit Transceivers ASICs,lpGBT,data serialisation,versatile optical link,transceiver package,EoS card designs,VTRx+ ASICs,EoS cards electronic design,integration tests,optical signal quality,Quality Control procedure,HL-LHC operation,quality control tests
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要