Carbon Capping for Specimen Preparation of Atom Probe Samples with Features of Interest Near the Surface

Journal Article Carbon Capping for Specimen Preparation of Atom Probe Samples with Features of Interest Near the Surface Get access Edwin Supple, Edwin Supple Colorado School of Mines, Golden, CO, United States of America Corresponding author: esupple@mines.edu Search for other works by this author on: Oxford Academic Google Scholar Chomani Gaspe, Chomani Gaspe Laboratory for Physical Sciences, College Park, MD, United States Search for other works by this author on: Oxford Academic Google Scholar Kevin J Dwyer, Kevin J Dwyer Laboratory for Physical Sciences, College Park, MD, United States Search for other works by this author on: Oxford Academic Google Scholar Robert Butera, Robert Butera Laboratory for Physical Sciences, College Park, MD, United States Search for other works by this author on: Oxford Academic Google Scholar Christopher J K Richardson, Christopher J K Richardson Laboratory for Physical Sciences, College Park, MD, United States Search for other works by this author on: Oxford Academic Google Scholar Brian Gorman Brian Gorman Colorado School of Mines, Golden, CO, United States of America Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 28, Issue S1, 1 August 2022, Pages 744–746, https://doi.org/10.1017/S1431927622003439 Published: 01 August 2022