Electron Counted STEM-EELS Spectroscopy Optimized for Low Kv (< 80 Kv) Via Hybrid Pixel Detection

Journal Article Electron Counted STEM-EELS Spectroscopy Optimized for low kV (< 80 kV) via Hybrid Pixel Detection Get access Liam Spillane, Liam Spillane Gatan Inc., Pleasanton, CA, USA Corresponding author: liam.spillane@ametek.com Search for other works by this author on: Oxford Academic Google Scholar Roberto dos Reis, Roberto dos Reis Northwestern University, Department of Materials Science and Engineering, Evanston, IL, USANUANCE Center, Northwestern University, Evanston, IL, USA Search for other works by this author on: Oxford Academic Google Scholar Anahita Pakzad, Anahita Pakzad Gatan Inc., Pleasanton, CA, USA Search for other works by this author on: Oxford Academic Google Scholar Ray D Twesten Ray D Twesten Gatan Inc., Pleasanton, CA, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 28, Issue S1, 1 August 2022, Pages 2226–2228, https://doi.org/10.1017/S1431927622008583 Published: 01 August 2022