Structural peculiarities of e-Fe2O3/GaN epitaxial layers unveiled by high-resolution transmission electron microscopy and neutron reflectometry

Sergey M. Suturin,Polina A. Dvortsova,Leonid A. Snigirev,Victor A. Ukleev,Takayasu Hanashima,Marcos Rosado,Belen Ballesteros

Materials Today Communications（2022）

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Iron oxides,Epsilon ferrite,Room temperature multiferroic,GaN,PLD epitaxial films,Electron diffraction,High resolution transmission electron,microscopy

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