Effect of Semiconducting Layer on Cable Insulation Damage Detection Using Surface Wave Reflectometry
2022 IEEE ELECTRICAL INSULATION CONFERENCE (EIC)(2022)
摘要
This paper presents a study of the effect of the semiconducting layer present in medium and high voltage cables on surface wave propagation and its feasibility in detecting insulation damage on cables. Simulation studies were conducted using Ansys High Frequency Structure Simulator (HFSS). It was observed that attenuation increased with thicker semiconducting layer and higher conductivity of the layer. For instance, on a 24.4 mm diameter power cable, the electric field strength associated with a 1 GHz surface wave declines with distance and fades away after 30 m when a 2 mm thick semiconducting layer is present. More results as a function of semiconducting layer thickness, material conductivity and permittivity, distance of a damaged section, etc. will be presented.
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关键词
reflectometry,unshielded power cable,semiconducting layer,frequency domain reflectometry,insulation damage,non-intrusive,non-destructive evaluation (NDE),surface waves
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