Insight into Interface Electrical Properties of Metal–oxide–semiconductor Structures Fabricated on Mg-implanted GaN Activated by Ultra-High-pressure Annealing

Yuhei Wada,Hidetoshi Mizobata, Mikito Nozaki,Takuma Kobayashi,Takuji Hosoi, Tetsu Kachi, Takayoshi Shimura,Heiji Watanabe

Applied physics letters(2022)

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