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Insights into the Structure and Self‐Assembly of Organic‐Semiconductor/Quantum‐Dot Blends

Daniel T. W. Toolan,Michael P. P. Weir,Shuangqing Wang,Simon A. A. Dowland,Zhilong Zhang,James Xiao,Jonathan Rawle,Neil Greenham,Richard H. H. Friend,Akshay Rao,Richard A. L. Jones,Anthony J. J. Ryan

NANOSCALE HORIZONS（2023）

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关键词
energy materials,grazing incidence wide angle X-ray scattering,self-assembly,semiconductor nanocrystals,small-angle neutron scattering,thin films
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