Internal structures of atom microscopy using reflection and transmission spectrum

We investigate two-dimensional atom microscopy by reflection and transmission spectrums using a position range of $$-0.5\lambda \le x\le 0.5\lambda ,~-0.5\lambda \le y\le 0.5\lambda $$ . The central raising and depth peak are determined through reflection and transmission spectra. The central raising and depth peaks show the nuclear region, while around the central peak region, localised craters show the shell regions in the wavelength domain. Depth crater-like localisation with a central peak at the centre is also reported by transmission spectrum. A central localised region of the nucleus of an atom and the surrounding region of shell are also investigated by both reflection and transmission spectra. The results of this work show important applications in laser cooling and nano-lithography.