RF Read-Out of Minority Carrier Lifetimes in Micro-Scale Infrared Materials

Sukrith Dev,Yaguo Wang,Kyounghwan Kim,Marziyeh Zamiri,Clark Kadlec,Michael Goldflam,S. D. Hawkins,Eric A. Shaner,Jin K. Kim,Sanjay Krishna,Monica S. Allen,Jeffery Allen,Emanuel Tutuc,Daniel Wasserman

conference on lasers and electro optics（2019）

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摘要

We present micro-scale time-resolved microwave resonator response (μ-TRMRR), a sensitive technique capable of measuring carrier lifetimes in micron-scale materials, something not typically achievable using common techniques like time-resolved photoluminescence or time-re-solved microwave reflectance. © 2019 The Author(s)

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