Workload-Aware Static Aging Monitoring and Mitigation of Timing-Critical Flip-FlopsSheldon Tan,Mehdi Tahoori,Taeyoung Kim,Shengcheng Wang,Zeyu Sun,Saman KiamehrLong-Term Reliability of Nanometer VLSI Systems(2019)引用 2|浏览8暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要