Single-shot Experiments at the Soft X-FEL FERMI Using a Back-Side-illuminated Scientific CMOS Detector

Cyril Leveille,Kewin Desjardins,Horia Popescu,Boris Vondungbo,Marcel Hennes,Renaud Delaunay,Emmanuelle Jal,Dario De Angelis,Matteo Pancaldi,Emanuele Pedersoli,Flavio Capotondi,Nicolas Jaouen

Journal of synchrotron radiation（2022）

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摘要
The name of one of the authors in the article by Léveillé et al. [(2022), J. Synchrotron Rad. 29, 103-110] is corrected.
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关键词
CMOS,soft X-ray FEL applications,single-shot experiment,time resolved
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