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Low-Pass NGD Numerical Function and STM32 MCU Emulation Test

IEEE Transactions on Industrial Electronics(2022)

Cited 7|Views5
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Key words
Delays,Delay effects,Cutoff frequency,Time-domain analysis,Quality of service,Microcontrollers,Bandwidth,Circuit design,emulation,microcontroller unit (MCU),negative group delay (NGD),numerical circuit,time-domain demonstration
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