MICROTRON CT SYSTEM ACHIEVING 250 μm SPACE RESOLUTION WHICH IS UNABLE BY LINAC

More than one MeV X-ray energy is necessary to visualize inside of iron object thicker than 8 cm. Particularly it is necessary when 3D metal printing technology is in fashion, hollow detailed big metal object must be tested to find inside defects. We will show how X-ray CT image using Microtron (MIC) demonstrates space resolution as high as 250 μm. In addition very good contrast visualize density distribution at the density 0.1 g/cm3. For instance Tantalum and Tantalum Oxide can be identified by MIC-CT. Measurement of density distribution is carried out by neutron, but when focal point is an order of 100 μm, it is possible by Compton scattering with X-ray energy higher than MeV, since Compton scattering cross section is proportional to the electron density, instead of atomic number, while the photo electron scattering is proportional to the atomic number Z4.