SAPIENS: A 64-kb RRAM-Based Non-Volatile Associative Memory for One-Shot Learning and Inference at the Edge

H Li, WC Chen,A Levy, CH Wang,H Wang,PH Chen,W Wan,WS Khwa

IEEE TRANSACTIONS ON ELECTRON DEVICES（2021）

引用 31|浏览25

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关键词

Feature extraction, Computer architecture, Sensors, Microprocessors, Voltage measurement, Programming, Resistance, Associative memory (AM), memory-augmented neural networks (MANNs), one-shot learning, resistive random access memory (RRAM, ReRAM)

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