Host-to-Guest Energy Transfer and Its Role in the Lower Stability of Solution-Coated Versus Vacuum-Deposited Phosphorescent OLEDs

Electroluminescence (EL) degradation mechanisms in solution-coated (SOL) host:guest (H:G) systems commonly used in phosphorescent organic light-emitting diodes (OLEDs) are investigated and compared to their vacuum-deposited (VAC) counter-parts. Changes in the EL, photoluminescence (PL), and time-resolved PL (TRPL) characteristics of devices comprising SOL or VAC H:G light-emitting layers (EMLs) made of the same materials and in the same device architectures during prolonged electrical driving are compared and analyzed. Hole-only devices are also utilized to study the effects of charges and excitons, separately and combined. Moreover, devices with double EMLs comprising SOL and VAC components are tested to glean additional insights into the role of host excitons in device degradation. The results indicate that the faster degradation of SOL EML devices relative to their VAC EML counterparts under electrical stress is due-at least in part-to the less efficient host-to-guest (H -> G) energy transfer in these systems, which accelerates molecular aggregation in the EML. Interactions between excitons and polarons in the EMLs induce this aggregation phenomenon which occurs more strongly in the case of SOL EMLs compared to their VAC counterparts because of the higher host exciton concentration in the former as a result of the less efficient H -> G energy transfer. The findings shed light on one of the root causes of the limited stability of SOL OLEDs.