Advanced Technique For Achieving 10-? M-Width Fine Lines In Roll-To-Roll Continuous Gravure Printing

In roll-to-roll continuous printing, given the limitations in the pattern engraving technique and the need for accurate contact angle control between the ink and substrate, printing fine lines in the 10-?m scale is a major hurdle that needs to be addressed to achieve mass production of printed electronic devices. To address this issue, we propose a novel printing method based on gradation engraving; this method allows for both greater control over the width decrement of printed patterns as well as narrower fine lines than those achieved using an engraved pattern in the printing roll. Our experimental results show that, using the proposed method, printed line widths could be decreased according to the curvature of the sidewall of the engraved cell, even in the same aspect ratio. Furthermore, the width of the printed pattern was decreased by up to 62%, as compared to that achieved via the engraved cell, and a fine printed line narrower than 10-?m could be achieved. The proposed method represents a suitable alternative for the fabrication of 10-?m, or even thinner, fine conductive lines via the roll-to-roll continuous printing process.