Measurement in-plane deformations in electronic speckle pattern interferometry using phase-shifting modulated by polarization
Optics Communications(2021)
摘要
We propose to combine electronic speckle pattern interferometry with polarizing phase-shifting techniques to measure in-plane displacement fields. We present the technical and theoretical procedures for its implementation, added with the necessary calibration procedures employing a commercial polarimeter. Finally, we tested our proposal experimentally using a two-phase step algorithm to measure in-plane displacements on a latex sample.
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关键词
Electronic speckle pattern interferometry,Optical metrology,Phase shifting,In-plane displacement,interferometry
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