Effects Of Static And Pulsed Negative Bias Temperature Stressing On Lifetime In P-Channel Power Vdmosfets
INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS（2013）
Key words
Lifetime estimation, NBTI, VDMOSFET
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined