The Impact of Forming Gas Annealing on the Electrical Characteristics of Sulfur Passivated Al2o3/In0.53ga0.47as (110) Metal-Oxide-Semiconductor Capacitors

Yen-Chun Fu,Uthayasankaran Peralagu,David A. J. Millar,Jun Lin,Ian Povey, Xu Li,Scott Monaghan,Ravi Droopad,Paul K. Hurley,Iain G. Thayne

APPLIED PHYSICS LETTERS（2017）

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