Single-Event Evaluation Of Xilinx 16nm Ultrascale Plus (Tm) High-Bandwidth Memory Enabled Fpga

Single-event characterization of a Xilinx 16nm UltraScale+ Virtex high bandwidth memory (IIBM)-enabied FPGA was performed using both the 64 MeV proton beam at Crocker Nuclear Laboratory and the neutron beam at LANSCE. Both single-event upset (SEU) and single-event functional interrupt (SEFI) analysis were performed on IIBM stacks, fabric interface and IIBM interface.