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Effective Measurement of the Wavelength Accuracy Calibration by Using Monte Carlo Uncertainty Calculation

AIP conference proceedings(2019)

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摘要
In this paper, a new effective wavelength calibration technique has been investigated and calculated for the calibration of different monochromator systems. Different calibration lamps have been tested effectively with respect to similar studies. Extended wavelength accuracy calibration has been made for the spectrophotometer systems, which have different grating with different spectral range. For each grating, different calibration lamps was used. Wavelength calibration over extended range has been possible by using orders of gratings. Integrating sphere usage has been a simpler way compared to conventional optical setups and a unique approach on uniformly transferring radiation of the calibration lamps to monochromator systems. This experimental setup, allows the correct wavelength of the radiation to reach entrance slit without causing optical aberrations. Many parameters have been analyzed in uncertainty measurements both standard uncertainty calculation method, which are based on the "Guide to the Expression of Uncertainty in Measurement" (GUM) and other method is the Monte Carlo (MC) described in e GUM Supplement-1. Hence, the precision is improved in results. Extended uncertainty results are in between 0.02 nm and 0.3 nm with 95% confidence level (k=2) for both monochromator systems.
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关键词
wavelength calibration,diffraction orders,Monte Carlo uncertainty
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