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Development of planarizing spin-on carbon material for high-temperature processes

2021 China Semiconductor Technology International Conference (CSTIC)(2021)

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摘要
For the last several advanced semiconductor nodes, as the industry moves towards 7- and 5-nm processes, the requirements for patterning and image transfer have increased dramatically. Multilayer material stacks are needed to pattern complex high-resolution structures. For carbon films, one key point is the tradeoff between planarization and high-temperature stability requirements used in patternin...
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关键词
Resistance,Solvents,Planarization,Films,Lithography,Surfaces,Inspection
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