Highly water-impermeable SiN x film prepared using surface-wave-plasma chemical vapor deposition and improvement of the barrier performance for organic light-emitting displays

Thin Solid Films(2015)

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Abstract
Under the previously developed conditions for highly transparent SiNx films, a highly water-impermeable SiNx film was obtained using surface-wave-plasma enhanced chemical vapor deposition (SWP-CVD) with an increased distance between the dielectric window and a substrate (gap), where a water vapor transmission rate (WVTR) of 1.0×10−5g/m2/day was achieved with a gap of 200mm. Evaluation of the WVTR indicated that deposition of the SiNx film on both sides of a polyimide base film was more effective than simply increasing the SiNx film thickness. A plasma polymerized SiOxCy film was prepared using SWP-CVD in a vacuum, similar to preparation of SiNx barrier film instead of the polyimide base film. A multilayer structure with a SiOxCy intermediate layer between the SiNx barrier layers resulted in high barrier performance with a low WVTR of 2.0×10−5g/m2/day that could be applied for the fabrication of organic light-emitting diode devices.
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Key words
Surface wave plasma,Chemical vapor deposition,Silicon nitride,Low temperature,Water-impermeable,Multilayer structure,Defect decoupling,High barrier
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