Degradation pattern of contact resistance and characteristic trap energy in blue organic light-emitting diodes

Thin and lightweight organic light-emitting diodes (OLEDs) are promising candidates for next-generation rollable displays; they offer numerous advantages, such as scalable manufacturing, high color contrast ratio, flexibility, and wide viewing angle. Despite the numerous merits of OLEDs, the insufficient lifetime and stability of blue OLEDs remain unresolved, thereby necessitating a feedback strategy for lifetime extension. Herein, we propose a simple yet effective methodology to determine the contact resistance (RCT) and characteristic trap energy (ET) of OLEDs simultaneously in the trapped-charge-limited-conduction regime, where electroluminescence occurs primarily. To validate our approach, the extracted RCT and ET values are directly compared with each other by connecting a commercial resistor (RC) to a blue OLED in series. The percent errors discovered in RC and ET are less than 7% and 4%, demonstrating the high feasibility and accuracy of our approach. We further employ this method to study the degradation mechanism of a blue OLED by presenting the electrical stress time- and cycle-dependent RCT, ET, ideality factor, and turn-on voltage, revealing different degradation patterns of the metal-to-transport layer interface and emission layer, respectively. Our results provide better insights into the electrical parameter extraction method and electrical current degradation mechanism in blue OLEDs.