Disentangling Elastic Relaxation and Ferroelectric Domain Contributions to in Plane X-ray Scattering Profile: A Necessity in Strained Ferroelectric Superlattices
Materials letters(2020)
摘要
Ferroelectric nanodomains give rise to diffuse X-ray scattering peaks in ultrathin films. Here we study a Pb(Zr0.2Ti0.8)O-3/SrTiO3 superlattice, using X-ray diffraction and transmission electron microscopy, We show that both elastic relaxation and ferroelectric nanodomain pattern can contribute to distinct satellite peaks in the X-ray scattering pattern. We show that transmission electron microscopy is required to disentangle elastic relaxation and ferroelectric domain contributions to the in plane X-ray scattering profile. (C) 2020 Elsevier B.V. All rights reserved.
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关键词
Ferroelectrics,Superlattice,Thin films,Domain structure,X-ray scattering
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