Impact of invasive metal probes on Hall measurements in semiconductor nanostructuresJan G. Gluschke,Jakob Seidl,H. Hoe Tan,Chennupati Jagadish,Philippe Caroff,Adam P. MicolichNANOSCALE（2020）引用 5|浏览25暂无评分关键词hall measurements,semiconductor nanostructures,invasive metal probesAI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
