Integrated Control System for an X-Band-Based Laser-Compton X-Ray Source

LLNL’s compact, tunable, laser-Compton x-ray source has been built around an advanced X-band photogun and accelerator sections and two independent laser systems. In support of this source, the control system has developed into an integrated architecture that continues to grow to simplify operation of the system and to meet new needs of this research capability. In addition to a PLC-based machine protection component, a custom, LabView-based suite of control software monitors systems including low level and high power RF, vacuum, magnets, and beam imaging cameras. This system includes a comprehensive operator interface, automated arc detection and rf processing to optimize rf conditioning of the high-gradient structures, and automated quad-scanbased emittance measurements to explore the beam tuning parameter space. The latest upgrade to the system includes a switch from real-time OS to FPGA-based low-level RF generation and arc detection. This offloads processing effort from the main processor allowing for arbitrary expansion of the monitored points. It also allows the possibility of responding to arcs before the pulse is complete.