Preparation and Characterization of NiS Thin film on ITO coated Glass substrate for Solar cell Applications

Thin films of NiS have been deposited on indium doped tin oxide coated conducting glass substrates using chemical bath deposition technique. The X-ray diffraction was used to obtain structural characterization. Structural parameters such as crystallite size, strain and dislocation density are calculated for films with different thickness values obtained. Optical absorption analysis showed that the deposited films possess band gap value around 0.7 eV. The film composition and surface morphology have been analyzed using scanning electron microscopy and energy dispersive analysis by X-rays. Keywords— NiS, Thin film, CBD, SEM