Gate Reflectometry For Probing Charge And Spin States In Linear Si Mos Split-Gate Arrays
2019 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM)(2019)
摘要
We fabricated linear arrangements of multiple split-gate devices along an SOT mesa, thus forming a 2 x N array of individually controllable Si quantum dots (QDs) with nearest neighbor coupling. We implemented two different gate reflectometry-based readout schemes to either probe spin-dependent charge movements by a coupled electrometer with single-shot precision, or directly sense a spin-dependent quantum capacitance. These results bear significance for fast, high-fidelity single-shot readout of large arrays of foundry compatible Si MOS spin qubits.
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关键词
nearest neighbor coupling,coupled electrometer,single-shot precision,spin-dependent quantum capacitance,high-fidelity single-shot readout,multiple split-gate devices,SOI mesa,quantum dots,gate reflectometry-based readout schemes,foundry-compatible MOS spin qubits,linear MOS split-gate arrays,spin-dependent charge movements
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