Random Telegraph Noises from the Source Follower, the Photodiode Dark Current, and the Gate-Induced Sense Node Leakage in CMOS Image Sensors
SENSORS（2019）
关键词
CMOS image sensor (CIS),random telegraph signal (RTS),random telegraph noise (RTN),MOSFET channel RTN (MC-RTN),variable junction leakage (VJL),dark current (DC),gate induced drain leakage (GIDL),correlated double sampling (CDS),correlated multiple sampling (CMS),X-ray irradiation
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