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Machine Learning, Markov Chain Monte Carlo, And Optimal Algorithms To Characterize The Advact Kilopixel Transition-Edge Sensor Arrays

Maria Salatino,Jason Austermann,James A. Beall,Steve Choi,Kevin T. Crowley,Shannon Duff,Shawn W. Henderson,Gene Hilton,S.-P. P. Ho,Johannes Hubmayr,Yaqiong Li,Michael D. Niemack,Sara M. Simon,Suzanne T. Staggs,Edward J. Wollack

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY（2019）

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关键词
Kilopixel focal planes, Machine Learning, Markov Chain Monte Carlo, Transition-Edge Sensor
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