High Precision Detection of Change in Intermediate Range Order of Amorphous Zirconia-Doped Tantala Thin Films Due to Annealing

K. Prasai,J. Jiang,A. Mishkin,B. Shyam,S. Angelova,R. Birney,D. A. Drabold,M. Fazio,E. K. Gustafson,G. Harry,S. Hoback,J. Hough,C. Levesque,I MacLaren,A. Markosyan,I. W. Martin,C. S. Menoni, P. G. Murray,S. Penn,S. Reid,R. Robie,S. Rowan,F. Schiettekatte,R. Shink, A. Turner,G. Vajente,H-P Cheng,M. M. Fejer,A. Mehta,R. Bassiri

Physical review letters（2019）

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关键词
Thin Film Analysis,High-Speed Imaging,Detection,Surface Characterization,Imaging
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