1.5 Port Vector Spectrometer for Terahertz Time Domain Spectroscopy
International Conference on Infrared, Millimeter, and Terahertz Waves(2018)
摘要
We demonstrate a spectrometer capable of measuring terahertz time domain transmission and reflection spectroscopy simultaneously in a single setup. This facilitates highly accurate determination of optical material parameters and the geometric thickness by taking advantage of both geometries. The system is also suitable for parameter extraction for materials when data from transmission geometry cannot be extracted and for characterizing non-time-invariant devices such as optical isolators.
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关键词
reflection spectroscopy,optical material parameters,geometric thickness,parameter extraction,transmission geometry,nontime-invariant devices,terahertz time domain transmission spectroscopy,1.5 port vector spectrometer,optical isolators
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