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Mapping TES Temperature Sensitivity and Current Sensitivity As a Function of Temperature, Current, and Magnetic Field with IV Curve and Complex Admittance Measurements.

Y. Zhou,C. V. Ambarish,R. Gruenke,F. T. Jaeckel,K. L. Kripps,D. McCammon,K. M. Morgan,D. Wulf, S. Zhang,J. S. Adams,S. R. Bandler,J. A. Chervenak,A. M. Datesman,M. E. Eckart,A. J. Ewin,F. M. Finkbeiner,R. L. Kelley,C. A. Kilbourne,A. R. Miniussi,F. S. Porter,J. E. Sadleir,K. Sakai,S. J. Smith,N. A. Wakeham,E. J. Wassell,W. Yoon

Journal of low temperature physics（2018）

Cited 7|Views93
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Key words
TES,Complex impedance,Temperature sensitivity,Current sensitivity,Weak-link effect,Josephson junction,Shapiro steps
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