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Mapping TES Temperature Sensitivity and Current Sensitivity As a Function of Temperature, Current, and Magnetic Field with IV Curve and Complex Admittance Measurements

Y. Zhou,C. V. Ambarish,R. Gruenke,F. T. Jaeckel,K. L. Kripps,D. McCammon,K. M. Morgan,D. Wulf, S. Zhang,J. S. Adams,S. R. Bandler,J. A. Chervenak,A. M. Datesman,M. E. Eckart,A. J. Ewin,F. M. Finkbeiner,R. L. Kelley,C. A. Kilbourne,A. R. Miniussi,F. S. Porter,J. E. Sadleir,K. Sakai,S. J. Smith,N. A. Wakeham,E. J. Wassell,W. Yoon

Journal of Low Temperature Physics（2018）

引用 7|浏览93
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关键词
TES,Complex impedance,Temperature sensitivity,Current sensitivity,Weak-link effect,Josephson junction,Shapiro steps
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