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3D Full-field Transmission X-ray Microscopy Based on Equally Sloped Tomography at Shanghai Synchrotron Radiation Facility

Microscopy and Microanalysis(2018)

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摘要
Three-dimensional full-field transmission X-ray microscopy (TXM) is capable of 3D imaging of morphology and structures with spatial resolution down to a few tens of nanometers. Many of hard Xray TXM facilities, both based on synchrotron radiation and tabletop X-ray sources, has been built up all over the world [1-3]. Recent developments have demonstrated that hard X-ray TXM is an effective and unique technique for non-destructive investigation of battery material under in-situ environment [2, 3]. Not only morphology of 2D and 3D structures, but also elemental distribution and chemical states of battery material can be obtained simultaneously.
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Soft X-ray Microscopy
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